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High-resolution materials characterisation

Pushing the boundaries of elemental characterisation and imaging in materials

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Nanostructuring of materials can yield novel and improved materials properties and enhanced materials performance. The ability to image and characterise these nanoscale features quickly and in high-resolution is therefore essential to drive technological progress.

This can be achieved by pushing scanning electron microscopy (SEM) to its limits, working in the nanoscale range of 1 – 100 nm, combined with energy dispersive X-ray spectroscopy (EDS) to chemically characterise features at scales unachievable using conventional EDS analysis.

In this webcast, the speakers will identify the challenges of high-resolution nanoscale SEM based characterisation, providing information on optimising microscope conditions to maximise results. They will demonstrate the strengths of combining high-resolution SEM with windowless EDS analysis to enable nanometre chemical analysis of key material features. Application examples will be shown from various samples, including steels/metals and semiconductors.

You will:

  • Understand the challenges of nanoscale feature characterisation within an SEM
  • Experience a range of examples where elemental characterisation is essential for understanding material performance
  • Understand the added value of windowless EDS detection for characterisation of nanoscale features
This webcast has been produced for Oxford Instruments NanoAnalysis by Nature Research Custom Media. The sponsor retains sole responsibility for content. About this content.


Dr. Sam Marks
TEM Product Manager
Oxford Instruments NanoAnalysis
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Dr. Ben Tordoff
Head of Materials Science
ZEISS Research Microscopy Solutions
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Dr. Kaoru Sato
Fellow, JFE-TEC
JFE Steel
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Moderator: Sarah Hiddleston
Science Journalist
Nature Research for Nature Middle East
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