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X-ray microscopy technology plays a key role in non-destructive three-dimensional (3D) imaging and tomography. It allows a user to focus on features varying in scale from nanometers to millimeters and offers a unique opportunity to study samples in situ. With these strengths, it should come as no surprise that XRM is being used to study an ever-increasing range of materials, from biological samples to batteries to advanced alloys to geological material, for both research and industrial applications.
This publication offers an overview of the latest XRM technology, and presents commentary from key researchers from some of the world-leading research facilities and laboratories who use XRM to meet their needs for flexible, high-resolution 3D and 4D imaging.