The recent adoption of CMOS-based cameras for the collection of Electron Backscatter Diffraction (EBSD) patterns has unlocked faster collection speeds at higher pixel resolution.  This technology enables rapid and accurate microstructural characterization of a wide range of materials.  This presentation will introduce EDAX’s new Velocity CMOS-based camera, and present numerous application examples.  Microstructural characterization strategies utilizing this new technology will also be discussed.

Presenter
Matt Nowell
EBSD Product Manager
EDAX Presenter
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Presenter
Chris Parmenter
Editor: Microscopy and Analysis
Wiley Moderator
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Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis

Thursday, March 28th @ 11:00am EST

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